| NUKLEONIKA 1994, 39(3):163-168
ASYMMETRIC PEAK PROFILES FOR X-RAY AND TOF NEUTRON DIFFRACTOMETRYW. Paszkowicz Institute of Physics, Polish Academy of Sciences, al. Lotników 32, 02-668 Warsaw, Poland A method of fitting asymmetric diffraction profiles which have characteristics of mixed Lorentzian/Gaussian distributions is presented. Examplary calculations for high resolution X-ray data are given. Close X |