| NUKLEONIKA 1995, 40(1):61-66
DETERMINATION OF THICKNESS AND COMPOSITION
OF THIN Sn-Pb LAYERS USING XRF TECHNIQUE
AND MULTIVARIATE
CALIBRATION PROCEDURE
P. Urbański, E. Kowalska, W. Antoniak
Institute of Nuclear Chemistry and Technology, 03-195 Warsaw, Dorodna 16, Poland
The partial least squares calibration technique was used for calibration of a simple XRF instrument
designed for simultaneous determination of the thickness and composition of Sn-Pb layers deposited
on printed boards. The design of the instrument and the software used was presented. The root mean
square errors of crossvalidtion for the determination of coating thickness and Sn content were 0.44 mm
and 2.8% within the ranges 3-10 mm and 55-70% Sn, respectively.
Close X |